SPEA engages itself with creativity and innovation in designing and manufacturing the most suitable test equipment -
the most advanced, most reliable, most convenient - for testing semiconductors and electronic boards.

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 3030 Test Cells
 Reach the highest throughput with a "DON'T CARE PACKAGE" integrated solution

 Overview back    Minimize

The 3030 In‐Line, with the SPEA automation units, can be composed in Multi-Station In-Line Test Cells allowing to increase the productivity while lowering the cost of test for high-volume lines.

The systems that compose the test cell work in a perfectly integrated way, multiplying the test throughput. Each tester can be equipped with multiple test engines, which can include the instrumentation for the  parallel multi-function test of the boards.

The test cell works automatically in full autonomy, loading the boards from the input line and unloading them on the output line (that can be doubled, and address the boards according to the test results).

The units used to create the test cells are the following:
 
- Conveyor
- Shuttle units
- Loading units
- Unloading units
- Flip over unit
 
You can find below some of the test cells that it is possible to create by using these units.

 
 Models back    Minimize

TC 3030 100
OPT + ICT/FCT

The Multi-Station OPT + ICT/FCT Test Cell consists of two test stations:
- The first test station executes optical inspection
- The second test station executes the in-circuit and functional test in parallel 
 

 

TC 3030 110
OPT + ICT + FCT

The Multi-Station OPT + ICT + FCT Test Cell consists of three test stations:

- The first test station executes an optical inspection
- The second test station executes the in-circuit test in parallel
- The third test station executes the functional test in parallel

This test cell is designed to respect the production line time even when the time required to execute the functional test is longer than the line beat rate. 

 

 

TC 3030 200
PARALLEL ICT/OBP/FCT

The ICT/OBP/FCT Parallel Test Cell consists of two stations in parallel, and is designed to double the tester productivity. The instrumentation of each tester performs, in parallel, in-circuit test, on-board programmind and functional test.
Each station is equipped with an Input and an Output buffer, in order to keep the station constantly supplied with boards to be tested. Each line segment (shuttle mechanism) is equipped with a dedicated CPU, so it does not need a supervisor in charge of test cell management. 

 

TC 3030 300
TWIN IN-LINE ICT/OBP/FCT

Two twin systems – which are completely compatible and interchangeable – are disposed in-line. Each tester performs the in-circuit test, the on-board programming and the functional test in parallel.

Unique advantage of this test cell is the possibility to keep using the line, without interruptions, even during the maintenance interventions: When one of the two testers is down, it is automatically bypassed, while the other one keeps working.

The boards are loaded from the input line, addressed to the first free tester, tested; then, they can be unloaded on a single output line (the test results are communicated via SMEMA) or on two different output lines, according to the test results (Pass/Fail). 

 

 






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