SPEA engages itself with creativity and innovation in designing and manufacturing the most suitable test equipment -
the most advanced, most reliable, most convenient - for testing semiconductors and electronic boards.

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 CT1000 series
 Smart Card, HF & UHF Testers

 Overview back    Minimize

CT1000 series is designed to satisfy all test needs of any kind of HF & UHF devices and smart cards (contact, contactless and combined), which utilize standard or customized protocols. These highly configurable and scalable testers can quickly perform measurements to satisfy both parametric and functional requirements of the smart card HF and UHF devices. A single platform for the full test coverage.

- ISO 18000
- ISO 7816
- ISO 7813
- ISO 14443 A/B
- ISO 15693
- MIFARE™
- DESFIRE™
- FeliCa™
- ISO 11784/85
- USB
- MMC
- I2C
- Customized protocols

 Features back    Minimize

- Contact/contactless/combined smart card test
- Standard & customized protocols
- Programmable Logic Units per channel
- HF test 13.56 MHz-15MHz
- UHF test 800 MHz-1 GHz 
- Short test time for ultra accurate measurement
- 32 synchronous or asynchronous devices in parallel
- Open/short/leakage preliminary test
- Capacitance/inductance measurement
- Passive device test
- Final test
- Working distance test with Antenna
- Signal clearness and strength test
- Windows based programming software

- Input Capacitance Test
- Input Inductance Test
- Open/Short/Leakage Test
- Passive Device Test
- Wafer Test
- Working Distance
- UHF Test






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