SPEA engages itself with creativity and innovation in designing and manufacturing the most suitable test equipment -
the most advanced, most reliable, most convenient - for testing semiconductors and electronic boards.

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 C320MX - SoC & SiP Testers

 

 Features back    Minimize

- Pin Count: 256 
- Digital Channels : 256* 
- Pattern Frequency: 40MHz 
- Clock Frequency: 50MHz 
- Pattern generation 
- RAM: Up to 2Mstep per PIN 
- Programmable Logic per PIN: Yes 
- High Precision PMU per PIN: 256ch 
- Digitizer: Up to 32ch (4chx8) 
- Arbitrary Waveform Generator: Up to 32ch (4chx8) 
- Counter: 8 units 
- DC Source: 6 Units (up to 100V) 
- RF Source: 1 (2GHz) 

 

*The digital channels cover 2 frequence ranges
-Up to 50 MHz
-Up to 200 MHz
 






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