The AC series allows the high-throughput, high-performance production test of MEMS microphones: The integration
with pick & place handler (H3500 series) and test system (ComptestMX series) provides a high-efficiency turn-key solution for lowering the cost of test while answering ever-changing test needs.

The module is able to produce the exact acoustic replicate of the electric input signals provided by the test system,
while insulating the device under test from all external noise.

The excellent insulation allows accurate and repeatable measurements, even at low frequencies, and well-defined uniform test conditions.

Complete integrated test cell

Pick&Place handler + SoC & SiP tester + Acoustic Chamber

High productivity, low cost of test

Multisite parallel microphone test: <1 sec / 8 sites 

Test Capabilities

- Sensitivity @ 1KHz, 1 Pa
- Frequency response
- Noise floor
- Signal to noise ratio
- Total harmonic distortion + noise @ 20 Hz - 20 KHz
- Parametric measurement
- Light stimulation 

Software for data collection, processing and analysis 

	Very Rapid Applications Development - Device Data Map Editor - Test Plan Map Editor - Bin Maps - Test Model Libraries - Pattern Data Import from simulator - Automatic Test Program Generation - Documentation and report generation
Software for production - Standard operator control panel - Real time in-line yield monitor - Retest on fail - Statistic production process data analysis - Sampling on the fly - Bin alert - Delta site yield alert
	Software for debugging - Instrument setting change on the fly - Shmoo plot (bi- or tridimensional) - Characterization - Virtual debugger by event view - Vector change on the fly - Acquisition memory display

The ATOSC2 system software allows you to develop and debug the test programs in a simple way, thanks to the VRAD (Very Rapid Application Development).

The Graphic User Interface and the algorithms used make quick and easy the use of the software functionalities. Test engineers can also program the system at low-level, through intuitive techniques of manual input.

The Automatic Test Program Generation is fast, thanks to structures based on family test libraries.